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Basic example source file for capi_selftest project. Copyright (c) 2025-2026 Analog Devices, Inc. More...
#include <errno.h>#include <stddef.h>#include <stdint.h>#include "common_data.h"#include "capi_uart.h"#include "test_framework.h"Macros | |
| #define | TEST_UART_TX_CHUNK 32U |
| Write test framework output through the configured CAPI UART. | |
Functions | |
| int | example_main (void) |
| Main function for basic example. | |
Basic example source file for capi_selftest project. Copyright (c) 2025-2026 Analog Devices, Inc.
SPDX-License-Identifier: BSD-3-Clause
| #define TEST_UART_TX_CHUNK 32U |
Write test framework output through the configured CAPI UART.
| context | - CAPI UART handle. |
| data | - Data to transmit. |
| length | - Number of bytes to transmit. |
| int example_main | ( | void | ) |
Main function for basic example.
Basic example main execution.
Basic example main executiont.
IIO descriptor and initialization parameter.
IIO app.
Declaring iio_devices structure
Initializing IIO app init param.
Initializing IIO app.
Running the IIO app (use iio_info or osc in terminal).
Set the threshold voltage to 5V
The comparator output will be available on the GPO_A pin
Set the DAC output on channel C to 5V
Measure input current on channel D
GPIO Pin Interrupt Controller
UART init params
IIO application descriptor
IIO application initialization parameters
iio axi adc configurations.
iio axi dac configurations.
iio instance descriptor.
iio instance descriptor.
iio device instance descriptor.
UART init params
IIO application descriptor
IIO application initialization parameters
iio axi adc configurations.
iio axi dac configurations.
iio instance descriptor.
iio instance descriptor.
iio device instance descriptor.
Negative temperature
Positive temperature
Negative temperature
Positive temperature